Products > Optical Microscope > Scanning Electron Microscope
Simple operation, Seamless Navigation, Live Analysis
The JCM-7000 Benchtop Scanning Electron Microscope is designed based on a key concept of "Easy-to-use SEM with seamless navigation and live analysis". The JCM-7000 incorporates three innovative functions; "Zeromag" for smooth transition from optical to SEM imaging, "Live Analysis" for finding constituent elements for an image observation area, and "Live 3D" for displaying a reconstructed live 3D image during SEM observation.
Ask for Demo >>
JEOL Zeromag & Live Analysis
JEOL Live 3D
*Photos and video courtesy of JEOL official website
This website was started with Mobirise